首页> 外文OA文献 >Tight-binding study of interface states in semiconductor heterojunctions
【2h】

Tight-binding study of interface states in semiconductor heterojunctions

机译:半导体异质结中界面态的紧束缚研究

代理获取
本网站仅为用户提供外文OA文献查询和代理获取服务,本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文,但由于OA文献来源多样且变更频繁,仍可能出现获取不到、文献不完整或与标题不符等情况,如果获取不到我们将提供退款服务。请知悉。

摘要

Localized interface states in abrupt semiconductor heterojunctions arestudied within a tight-binding model. The intention is to provide a microscopicfoundation for the results of similar studies which were based upon thetwo-band model within the envelope function approximation. In a two-dimensionaldescription, the tight-binding Hamiltonian is constructed such that theDirac-like bulk spectrum of the two-band model is recovered in the continuumlimit. Localized states in heterojunctions are shown to occur under conditionsequivalent to those of the two-band model. In particular, shallow interfacestates are identified in non-inverted junctions with intersecting bulkdispersion curves. As a specific example, the GaSb-AlSb heterojunction isconsidered. The matching conditions of the envelope function approximation areanalyzed within the tight-binding description.
机译:在紧密绑定模型中研究了突然的半导体异质结中的局部界面状态。目的是为基于包络函数近似内的双频带模型的相似研究结果提供微观基础。在二维描述中,构造紧密绑定的哈密顿量,使得在连续范围内恢复两波段模型的狄拉克样体光谱。异质结中的局域状态显示为在与两带模型等效的条件下发生。特别是,在相交的体相分散曲线的同相结中识别出浅界面状态。作为具体示例,考虑了GaSb-AlSb异质结。在紧密绑定描述中分析了包络函数近似的匹配条件。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
代理获取

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号